ISSN 2687-0568

Electrical Characteristics and Peculiarities of Formation of Type II InAsSb/InAsSbP Heterostructures

Authors
I.D. Kirilenko 1 , M.S. Ruzhevich 1 , N.L. Bazhenov 2 , M.V. Tomkovich 2 , V.V. Romanov 2 , K.D. Moiseev 2 , K.D. Mynbaev 1, 2

1 Institute of Advanced Data Transfer, ITMO University, 49 Kronverkskiy, Saint-Petersburg 197101, Russia

2 Ioffe Institute, 26 Polytechnicheskaya, Saint-Petersburg 194021, Russia

Rev. Adv. Mater. Technol., 2024, vol. 6, no. 4, pp. 178–182
Abstract

This article presents the results of a study of current-voltage (I–V) characteristics of InAsSb/InAsSbP heterostructures with an InSb content in the InAsSb active region 0.06 and 0.09. Using these results, the results of electroluminescence studies, and the data of energy-dispersive X-ray spectroscopy obtained for InAsSbP films grown on InAs(Sb), it is shown that the peculiarities of formation of the InAsSb/InAsSbP heterointerface via the method of metalorganic vapor phase epitaxy can lead to the development of a type II heterojunction. At temperatures T ≤ 170 K, this is manifested in specific values of both the energy of electroluminescence spectrum maximum and the I–V cutoff value

Keywords
Solid solutions; InAsSbP; Electroluminescence; Heterostructures
References
Volume 6, No 4
pages 178-182
History
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